InGaAs Trap Detector: Advancing Toward a Short-Wave Infrared Standard with 1% Uncertainty
No additional requirements: Working data, derived data (OISM-provided Level 1 storage) Individual user responsibility: Publishable results, Published results (OISM-provided, Level 2 storage) Not available to the public: Working data, derived data (experimental raw data), and publishable results. Made available to the public as described below: Published results that appear in publicly accessible reports, such as in journals and conference proceedings.
Resources
2 resources available
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README
APPLICATION/VND.OPENXMLFORMATS-OFFICEDOCUMENT.WORDPROCESSINGML.DOCUMENT -
dataset
APPLICATION/ZIP
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Complete Metadata
| @type | dcat:Dataset |
|---|---|
| accessLevel | public |
| accrualPeriodicity | irregular |
| bureauCode |
[ "006:55" ] |
| contactPoint |
{ "fn": "Anouar Rahmouni", "hasEmail": "mailto:anouar.rahmouni@nist.gov" } |
| description | No additional requirements: Working data, derived data (OISM-provided Level 1 storage) Individual user responsibility: Publishable results, Published results (OISM-provided, Level 2 storage) Not available to the public: Working data, derived data (experimental raw data), and publishable results. Made available to the public as described below: Published results that appear in publicly accessible reports, such as in journals and conference proceedings. |
| distribution |
[ { "title": "README", "mediaType": "application/vnd.openxmlformats-officedocument.wordprocessingml.document", "downloadURL": "https://data.nist.gov/od/ds/mds2-3677/README.docx" }, { "title": "dataset", "mediaType": "application/zip", "downloadURL": "https://data.nist.gov/od/ds/mds2-3677/dataset.zip" } ] |
| identifier | ark:/88434/mds2-3677 |
| issued | 2025-03-20 |
| keyword |
[ "Calibration", "InGaAs photodiode.", "Trap detector", "metrology" ] |
| landingPage | https://data.nist.gov/od/id/mds2-3677 |
| language |
[ "en" ] |
| license | https://www.nist.gov/open/license |
| modified | 2025-01-02 00:00:00 |
| programCode |
[ "006:045" ] |
| publisher |
{ "name": "National Institute of Standards and Technology", "@type": "org:Organization" } |
| theme |
[ "Metrology:Optical, photometry, and laser metrology" ] |
| title | InGaAs Trap Detector: Advancing Toward a Short-Wave Infrared Standard with 1% Uncertainty |
