Sample Analyses: Thin sections made at UC Berkeley were brought to the USGS, Menlo Park, CA and were coated with 25 nm carbon. Samples were analyzed at the USGS in Menlo Park, CA in a Tescan VEGA3 Scanning Electron Microscope (SEM) equipped with an Oxford 50 mm2 X-MaxN energy dispersive spectrometer. Thin sections were imaged with backscatter electrons. Energy dispersive X-ray spectroscopy (EDS) analyses and images were collected with an accelerating voltage of 15 kV and a working distance of 15 mm. Database Contents: The data files for “Energy Dispersive X-ray Spectroscopy” contain representative element spectra analyses of samples UGB-TD-28, -30, -31, -32, -33, -36. Database Contents: The data files for “Energy Dispersive X-ray Spectroscopy” contain representative element spectra analyses of samples UGB-TD-28, 30, 31, 32, 33, 36.