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Diffraction Data for SRM 640f

Metadata Updated: July 29, 2022

The data from this instrument consists of sets of measurements of Xray intensity as a function of diffraction angle. Almost all of it is collected using a position-sensitive detector (PSD), and is stored in CIF format.

Access & Use Information

Public: This dataset is intended for public access and use. License: See this page for license information.

Downloads & Resources

Dates

Metadata Created Date March 11, 2021
Metadata Updated Date July 29, 2022

Metadata Source

Harvested from NIST

Additional Metadata

Resource Type Dataset
Metadata Created Date March 11, 2021
Metadata Updated Date July 29, 2022
Publisher National Institute of Standards and Technology
Maintainer
Identifier ark:/88434/mds2-2251
Data First Published 2020-06-22
Language en
Data Last Modified 2020-06-01 00:00:00
Category Materials:Materials characterization
Public Access Level public
Bureau Code 006:55
Metadata Context https://project-open-data.cio.gov/v1.1/schema/data.json
Schema Version https://project-open-data.cio.gov/v1.1/schema
Catalog Describedby https://project-open-data.cio.gov/v1.1/schema/catalog.json
Harvest Object Id 4d15af69-6d00-46c5-add0-6e8bf8f9e341
Harvest Source Id 74e175d9-66b3-4323-ac98-e2a90eeb93c0
Harvest Source Title NIST
Homepage URL https://data.nist.gov/od/id/mds2-2251
License https://www.nist.gov/open/license
Program Code 006:045
Source Datajson Identifier True
Source Hash 6d9a4cab4c0b06c9d35537551268d18c23f48d02
Source Schema Version 1.1

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