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    • Detecting counterfeit microelectronics via capacitive and inductive signatures

    Metadata Updated: October 20, 2021

    N/A

    Access & Use Information

    Public: This dataset is intended for public access and use. License: No license information was provided. If this work was prepared by an officer or employee of the United States government as part of that person's official duties it is considered a U.S. Government Work.

    Downloads & Resources

    Dates

    Metadata Created Date August 9, 2021
    Metadata Updated Date October 20, 2021

    Metadata Source

    Harvested from Federal Laboratory Consortium Data.json

    Other Data Resources

    Additional Metadata

    Resource Type Dataset
    Metadata Created Date August 9, 2021
    Metadata Updated Date October 20, 2021
    Publisher Federal Labs
    Maintainer
    Identifier 220059
    Data Last Modified 2021-04-14
    Public Access Level public
    Bureau Code 023:00
    Metadata Context https://project-open-data.cio.gov/v1.1/schema/catalog.jsonld
    Schema Version https://project-open-data.cio.gov/v1.1/schema
    Catalog Describedby https://project-open-data.cio.gov/v1.1/schema/catalog.json
    Data Quality True
    Harvest Object Id 9774e5ef-33e8-4d18-9b93-884ecab5c042
    Harvest Source Id e2fea7c3-e835-4880-bb0b-ed41d5c6ac85
    Harvest Source Title Federal Laboratory Consortium Data.json
    Program Code 023:019
    Source Datajson Identifier True
    Source Hash ca0fdaff7d937c7662ae0f36e40eba0221a117b8
    Source Schema Version 1.1

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