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Code for SerialTrack-XR particle tracking

Published by National Institute of Standards and Technology | National Institute of Standards and Technology | Catalog Last Checked: September 10, 2026 at 05:53 PM | Dataset Last Updated: November 27, 2023
This repository contains scripts for running a custom implementation of "SerialTrack" designed for 2D X-ray projection images taken during in situ micro-X-ray computed tomography (XCT) experiments. The particle tracking-based technique allows for surface displacement and strain fields to be measured during, for example, mini-tensile test motions. This provides quantitative visualization of non-uniformities in the strain field (i.e., necking, shear banding), direct measurement of applied strain to supplement crosshead-based data, and quantification of system drift, among other uses. The code is written in Matlab and developed under Releases 2021b - 2023b under Windows 10. In total the dataset consists of about 250 MB and 79 files.

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Complete Metadata
@type dcat:Dataset
accessLevel public
accrualPeriodicity irregular
bureauCode 
[
  "006:55"
]
contactPoint 
{
  "fn": "Alexander Landauer",
  "hasEmail": "mailto:alexander.landauer@nist.gov"
}
description This repository contains scripts for running a custom implementation of "SerialTrack" designed for 2D X-ray projection images taken during in situ micro-X-ray computed tomography (XCT) experiments. The particle tracking-based technique allows for surface displacement and strain fields to be measured during, for example, mini-tensile test motions. This provides quantitative visualization of non-uniformities in the strain field (i.e., necking, shear banding), direct measurement of applied strain to supplement crosshead-based data, and quantification of system drift, among other uses. The code is written in Matlab and developed under Releases 2021b - 2023b under Windows 10. In total the dataset consists of about 250 MB and 79 files.
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identifier ark:/88434/mds2-3118
issued 2023-12-07
keyword 
[
  "Particle tracking",
  "Surface strain measurement",
  "X-ray micro Computed Tomography"
]
landingPage https://data.nist.gov/od/id/mds2-3118
language 
[
  "en"
]
license https://www.nist.gov/open/license
modified 2023-11-27 00:00:00
programCode 
[
  "006:045"
]
publisher 
{
  "name": "National Institute of Standards and Technology",
  "@type": "org:Organization"
}
replaces ark:/88434/mds2-3118
theme 
[
  "Materials:Materials characterization",
  "Mathematics and Statistics:Image and signal processing",
  "Metrology:Dimensional metrology",
  "Metrology:Optical, photometry, and laser metrology"
]
title Code for SerialTrack-XR particle tracking

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