CHIPS Metrology Ontology
The CHIPS Metrology Ontology originated from a pragmatic desire to understand how the various research entities under the CHIPS Metrology described by the Seven Grand challenges (https://doi.org/10.6028/nist.chips.1000), are related to each other. The named classes within this ontology came from the data management plans and adjacent documents associated with the projects within the Severn Grand Challenges. The class hierarchy was mainly assembled by June Lau. Ontological fine-tuning was advised by Alden Dima, and occasionally with the aid of a large language model. We used the Provenance Ontology (https://www.w3.org/TR/prov-o/) as a base framework, while pre-populating certain classes, particularly around the materials science domain and electron microscopy application) with the Platform DigitalMaterial Core Ontology (https://doi.org/10.1016/j.matdes.2023.112603) and their Electron Microscopy Application Ontology (https://doi.org/10.1007/s40192-024-00378-y).
Resources
3 resources available
-
CHIPS METIS Semantics Products
TTL -
Readme file
TXT -
CHIPS Metrology Ontology
TTL
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Complete Metadata
| @type | dcat:Dataset |
|---|---|
| accessLevel | public |
| bureauCode |
[ "006:55" ] |
| contactPoint |
{ "fn": "June W. Lau", "hasEmail": "mailto:june.lau@nist.gov" } |
| description | The CHIPS Metrology Ontology originated from a pragmatic desire to understand how the various research entities under the CHIPS Metrology described by the Seven Grand challenges (https://doi.org/10.6028/nist.chips.1000), are related to each other. The named classes within this ontology came from the data management plans and adjacent documents associated with the projects within the Severn Grand Challenges. The class hierarchy was mainly assembled by June Lau. Ontological fine-tuning was advised by Alden Dima, and occasionally with the aid of a large language model. We used the Provenance Ontology (https://www.w3.org/TR/prov-o/) as a base framework, while pre-populating certain classes, particularly around the materials science domain and electron microscopy application) with the Platform DigitalMaterial Core Ontology (https://doi.org/10.1016/j.matdes.2023.112603) and their Electron Microscopy Application Ontology (https://doi.org/10.1007/s40192-024-00378-y). |
| distribution |
[ { "title": "CHIPS METIS Semantics Products", "format": "The ontology is in the .ttl format", "accessURL": "https://github.com/usnistgov/METIS-Semantics", "description": "This repo hosts CHIPS Metrology taxnomies, controlled vocabulary, and ontology" }, { "title": "Readme file", "mediaType": "text/plain", "downloadURL": "https://data.nist.gov/od/ds/mds2-4248/4248_README.txt" }, { "title": "CHIPS Metrology Ontology", "format": "Ontology file using the .ttl serialization", "mediaType": "application/octet-stream", "downloadURL": "https://data.nist.gov/od/ds/mds2-4248/cm_onto_public.ttl" } ] |
| identifier | ark:/88434/mds2-4248 |
| issued | 2026-08-27 |
| keyword |
[ "CHIPS Metrology", "CHIPS and Science Act", "METIS", "Metrology", "Metrology Ontology", "Ontology" ] |
| language |
[ "en" ] |
| license | https://www.nist.gov/open/license |
| modified | 2026-07-13 00:00:00 |
| programCode |
[ "006:047" ] |
| publisher |
{ "name": "National Institute of Standards and Technology", "@type": "org:Organization" } |
| rights | Results of the CHIPS and Science Act should be made available to domestic consumption only. |
| theme |
[ "Information Technology:Data and informatics", "Information Technology:Digital twins" ] |
| title | CHIPS Metrology Ontology |
