AVIRIS-3 L2A Orthocorrected Surface Reflectance, Facility Instrument Collection
This dataset contains Level 2A (L2A) surface reflectance images from the Airborne Visible / Infrared Imaging Spectrometer-3 (AVIRIS-3) instrument. This is the NASA Earth Observing System Data and Information System (EOSDIS) facility instrument archive of these data. The NASA AVIRIS-3 is a spectral mapping system that measures reflected radiance at 7.4-nm intervals in the Visible to Shortwave Infrared (VSWIR) spectral range from 390-2500 nm. Surface hemispherical directional reflectance was derived from calibrated radiance using an optimal estimation algorithm. For each flight line, two file types are included: orthocorrected surface reflectance (RFL_ORT) and orthocorrected reflectance uncertainty (UNC_ORT) in netCDF format. Both file types include data projected in a UTM coordinate system. In addition, ancillary files for each flight line are provided, including a quick look image in GeoTIFF format and text files in YAML format that document processing algorithms and parameters used during production.
Resources
5 resources available
-
Original Metadata
ISO -
Resource 2
JPEG -
Resource 3
PDF -
Resource 4
HTML -
Resource 5
BIN
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Complete Metadata
| @type | dcat:Dataset |
|---|---|
| accessLevel | public |
| bureauCode |
[
"026:00"
]
|
| contactPoint |
{
"fn": "Earthdata Forum",
"@type": "vcard:Contact",
"hasEmail": "mailto:earthdata-support@nasa.gov"
}
|
| description | This dataset contains Level 2A (L2A) surface reflectance images from the Airborne Visible / Infrared Imaging Spectrometer-3 (AVIRIS-3) instrument. This is the NASA Earth Observing System Data and Information System (EOSDIS) facility instrument archive of these data. The NASA AVIRIS-3 is a spectral mapping system that measures reflected radiance at 7.4-nm intervals in the Visible to Shortwave Infrared (VSWIR) spectral range from 390-2500 nm. Surface hemispherical directional reflectance was derived from calibrated radiance using an optimal estimation algorithm. For each flight line, two file types are included: orthocorrected surface reflectance (RFL_ORT) and orthocorrected reflectance uncertainty (UNC_ORT) in netCDF format. Both file types include data projected in a UTM coordinate system. In addition, ancillary files for each flight line are provided, including a quick look image in GeoTIFF format and text files in YAML format that document processing algorithms and parameters used during production. |
| distribution |
[
{
"@type": "dcat:Distribution",
"title": "Original Metadata",
"format": "ISO",
"mediaType": "text/xml",
"conformsTo": "http://www.isotc211.org/2005/gmi",
"description": "The metadata's original source.",
"downloadURL": "https://cmr.earthdata.nasa.gov/search/concepts/C3369603199-ORNL_CLOUD.iso19115"
},
{
"@type": "dcat:Distribution",
"format": "JPEG",
"mediaType": "image/jpeg",
"downloadURL": "https://daac.ornl.gov/AVIRIS/guides/AV3_L2A_RFL_Fig1.jpg"
},
{
"@type": "dcat:Distribution",
"format": "PDF",
"mediaType": "application/pdf",
"downloadURL": "https://data.ornldaac.earthdata.nasa.gov/public/aviris/AV3_L2A_RFL/comp/AV3_L2A_RFL.pdf"
},
{
"@type": "dcat:Distribution",
"format": "HTML",
"mediaType": "text/html",
"downloadURL": "https://doi.org/10.3334/ORNLDAAC/2357"
},
{
"@type": "dcat:Distribution",
"format": "BIN",
"mediaType": "application/octet-stream",
"downloadURL": "https://search.earthdata.nasa.gov/search?q=AV3_L2A_RFL_2357&ac=true"
}
]
|
| identifier | 10.3334/ORNLDAAC/2357 |
| keyword |
[
"earth-science-infrared-wavelengths-spectral-engineering-reflected-infrared",
"earth-science-surface-radiative-properties-land-surface-reflectance"
]
|
| license | https://www.usa.gov/government-works |
| modified | 2026-04-06 |
| programCode |
[
"026:000"
]
|
| publisher |
{
"name": "ORNL_DAAC",
"@type": "org:Organization"
}
|
| spatial |
"[[{"WestBoundingCoordinate":-178.68,"NorthBoundingCoordinate":72.6,"EastBoundingCoordinate":-66.18,"SouthBoundingCoordinate":16.5}],"CARTESIAN"]"
|
| temporal | 2023-07-05/2026-03-30 |
| theme |
[
"Earth Science"
]
|
| title | AVIRIS-3 L2A Orthocorrected Surface Reflectance, Facility Instrument Collection |
