Assessment of Accrued Damage and Remaining Useful Life in Leadfree Electronics Subjected to Multiple Thermal Environments of Thermal Aging and Thermal Cycling

Metadata Updated: March 23, 2019

A method has been developed for prognostication of accrued prior damage in electronics subjected to overlapping sequential environments of thermal aging and thermal cycling. The presented approach uses the LM Algorithm in conjunction with microstructural evolution of damage based leading indi- cator for estimating prior stress history. Specific damage proxies examined include the phase-growth indicator and the IMC thickness. The viability of the approach has been demonstrated for leadfree test assemblies subjected to thermal aging at 125 °C and redeployed in cyclic thermo-mechanical environment −55–125 °C. Damage equivalency relationships between thermal aging during storage life and the resulting reduction in thermo-mechanical reliability in cyclic thermal environments during field deployment has been derived and validated based on two damage proxies. Convergence of the damage mapping to a common solution from data based on the two separate leading indicators has been demonstrated. Assemblies subjected to sequential stresses have been prog- nosticated for accrued damage from sequential overlapping stresses of thermal aging and thermal cycling. Correlation between the prognosticated damage and the actual accrued damage demonstrates that the proposed approach can be used to assess damage accrued under overlapping thermo- mechanical stresses of thermal aging and thermal cycling. In addition, prognostics metrics have been used to quantitatively evaluate the performance of the prognostic algorithms using both the leading indicators. Results demonstrate that both damage proxies work well in estimating accrued damage and estimating residual life.

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Public: This dataset is intended for public access and use. License: U.S. Government Work

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Dates

Metadata Created Date August 1, 2018
Metadata Updated Date March 23, 2019
Data Update Frequency irregular

Metadata Source

Harvested from NASA Data.json

Additional Metadata

Resource Type Dataset
Metadata Created Date August 1, 2018
Metadata Updated Date March 23, 2019
Publisher Dashlink
Unique Identifier DASHLINK_689
Maintainer
Miryam Strautkalns
Maintainer Email
Public Access Level public
Data Update Frequency irregular
Bureau Code 026:00
Metadata Context https://project-open-data.cio.gov/v1.1/schema/catalog.jsonld
Metadata Catalog ID https://data.nasa.gov/data.json
Schema Version https://project-open-data.cio.gov/v1.1/schema
Catalog Describedby https://project-open-data.cio.gov/v1.1/schema/catalog.json
Datagov Dedupe Retained 20190322235447
Harvest Object Id 46d0fa42-57c5-4a81-a7af-6d3675d3d15c
Harvest Source Id 39e4ad2a-47ca-4507-8258-852babd0fd99
Harvest Source Title NASA Data.json
Data First Published 2013-04-10
Homepage URL https://c3.nasa.gov/dashlink/resources/689/
License http://www.usa.gov/publicdomain/label/1.0/
Data Last Modified 2018-07-19
Program Code 026:029
Source Datajson Identifier True
Source Hash 53f0c4265ba988b42dd59e14b18f4f21b7db5568
Source Schema Version 1.1

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