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#1 Federal
Diffraction data for SRM 1979
- Organization: National Institute of Standards and Technology
- Dataset Last Updated: November 10, 2020
These datasets are the high-resolution data collected at the APS 11-BM synchrotron beamline, and used to certify the microstructural characteristics of the two components (15 nm and 60 nm nominal...
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Search relevance: 246.26 | Views last month: 2 | Catalog Last Checked: September 10, 2026 at 05:51 PM
#2 Federal
Diffraction data for SRM 1979
- Organization: Department of Commerce
- Dataset Last Updated: November 10, 2020
These datasets are the high-resolution data collected at the APS 11-BM synchrotron beamline, and used to certify the microstructural characteristics of the two components (15 nm and 60 nm nominal...
- FILE
- ZIP
- TXT
Search relevance: 245.30 | Views last month: 0 | Catalog Last Checked: October 02, 2026 at 07:52 PM

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