• Organization: National Institute of Standards and Technology
• Dataset Last Updated: December 01, 2010

The NIST Electron Inelastic-Mean-Free-Path Database provides values of electron inelastic mean free paths (IMFPs) principally for use in surface analysis by Auger-electron spectroscopy and X-ray...

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• Organization: National Institute of Standards and Technology
• Dataset Last Updated: October 10, 2012

NIST X-ray Photoelectron Spectroscopy Database XPS contains over 33,000 data records that can be used for the identification of unknown lines, retrieval of data for selected elements (binding...

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• Organization: National Institute of Standards and Technology
• Dataset Last Updated: January 01, 2012

Note that this SRD supersedes SRD 64 Version 3.2. The NIST Electron Elastic-Scattering Cross-Section Database provides values of differential elastic-scattering cross sections, total...

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• Organization: U.S. Environmental Protection Agency
• Dataset Last Updated: May 25, 2015

The dataset contains the data that underlies the figures and tables in the published article. It also contains the data that underlies the figures in supplemental material. This dataset is...

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• Organization: National Institute of Standards and Technology
• Dataset Last Updated: January 01, 2012

**** Note that this SRD is superseded by SRD 64 Version 4.0. ****The NIST Electron Elastic-Scattering Cross-Section Database provides values of differential elastic-scattering cross sections,...

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• Organization: National Institute of Standards and Technology
• Dataset Last Updated: January 01, 2014

The NIST Database of Cross Sections for Inner-Shell Ionization by Electron or Positron Impact provides cross sections for ionization of the K shell and of the L and M subshells of neutral atoms of...

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• Organization: National Institute of Standards and Technology
• Dataset Last Updated: November 01, 2014

The NIST Database for the Simulation of Electron Spectra for Surface Analysis (SESSA) can be used to simulate Auger-electron spectra and X-ray photoelectron spectra of nanostructures such as...

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• Organization: National Institute of Standards and Technology
• Dataset Last Updated: January 01, 2011

The NIST Electron Effective Attenuation Length Database provides values of electron effective attenuation lengths (EALs) in materials at user-selected electron energies between 50 eV and 2,000 eV....

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• Organization: National Institute of Standards and Technology
• Dataset Last Updated: July 01, 2015

This database provides values of backscattering correction factors (BCF) of homogeneous materials for quantitative surface analyses by Auger electron spectroscopy. These BCFs are obtained from...

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