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NIST X-ray Photoelectron Spectroscopy Database XPS contains over 33,000 data records that can be used for the identification of unknown lines, retrieval of data for selected elements (binding...
Search relevance: 1.00 | Views last month: 75 | Catalog Last Checked: August 03, 2026 at 03:49 AM -
The NIST Electron Inelastic-Mean-Free-Path Database provides values of electron inelastic mean free paths (IMFPs) principally for use in surface analysis by Auger-electron spectroscopy and X-ray...
Search relevance: 1.00 | Views last month: 10 | Catalog Last Checked: August 03, 2026 at 03:49 AM -
The 12 X-Ray Photometers (XP) aboard SEE perform full-disk irradiance measurements of the Sun for about 3 minutes every orbit (97 minutes) which usually gives 14-15 measurements per day. 8 of the...
Search relevance: 1.00 | Views last month: 6 | Catalog Last Checked: June 23, 2026 at 09:07 PM -
The NIST Electron Effective Attenuation Length Database provides values of electron effective attenuation lengths (EALs) in materials at user-selected electron energies between 50 eV and 2,000 eV....
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The data set shows 1) adsorption kinetics and capacities for Cd(II), Ni(II), Zn(II), Co(II), Pb(II), and Cu(II) as affected by pH and ionic strength; 2) hydrodynamic diameter of nanomaterials as a...
Search relevance: 1.00 | Views last month: 4 | Catalog Last Checked: August 03, 2026 at 12:44 AM -
The 12 X-Ray Photometers (XP) aboard SEE perform full-disk irradiance measurements of the Sun for about 3 minutes every orbit (97 minutes) which usually gives 14-15 measurements per day. 8 of the...
Search relevance: 1.00 | Views last month: 3 | Catalog Last Checked: August 04, 2026 at 11:19 PM -
The NIST Database for the Simulation of Electron Spectra for Surface Analysis (SESSA) can be used to simulate Auger-electron spectra and X-ray photoelectron spectra of nanostructures such as...
Search relevance: 1.00 | Views last month: 2 | Catalog Last Checked: August 03, 2026 at 03:49 AM
