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NIST X-ray Photoelectron Spectroscopy Database XPS contains over 33,000 data records that can be used for the identification of unknown lines, retrieval of data for selected elements (binding...
Search relevance: 1.00 | Views last month: 87 | Catalog Last Checked: September 10, 2026 at 05:50 PM -
The NIST Electron Effective Attenuation Length Database provides values of electron effective attenuation lengths (EALs) in materials at user-selected electron energies between 50 eV and 2,000 eV....
Search relevance: 1.00 | Views last month: 12 | Catalog Last Checked: September 10, 2026 at 05:50 PM -
**** Note that this SRD is superseded by SRD 64 Version 4.0. **** The NIST Electron Elastic-Scattering Cross-Section Database provides values of differential elastic-scattering cross sections,...
Search relevance: 1.00 | Views last month: 7 | Catalog Last Checked: September 10, 2026 at 05:50 PM -
Note that this SRD supersedes SRD 64 Version 3.2. The NIST Electron Elastic-Scattering Cross-Section Database provides values of differential elastic-scattering cross sections, total...
Search relevance: 1.00 | Views last month: 3 | Catalog Last Checked: September 10, 2026 at 05:51 PM -
The NIST Database for the Simulation of Electron Spectra for Surface Analysis (SESSA) can be used to simulate Auger-electron spectra and X-ray photoelectron spectra of nanostructures such as...
Search relevance: 1.00 | Views last month: 2 | Catalog Last Checked: September 10, 2026 at 05:50 PM -
The results demonstrate the Ag 3d5/2-3/2 spectrum of the pristine AgNPs. Furthermore, the XAS spectra from the analysis of the nanosilver solution (ASAP-AGX-32) after the disinfection process is...
Search relevance: 1.00 | Views last month: 1 | Catalog Last Checked: September 10, 2026 at 06:53 PM -
Note that this SRD supersedes SRD 64 Version 3.2. The NIST Electron Elastic-Scattering Cross-Section Database provides values of differential elastic-scattering cross sections, total...
Search relevance: 1.00 | Views last month: 0 | Catalog Last Checked: October 02, 2026 at 07:51 PM -
The NIST Electron Effective Attenuation Length Database provides values of electron effective attenuation lengths (EALs) in materials at user-selected electron energies between 50 eV and 2,000 eV....
Search relevance: 1.00 | Views last month: 0 | Catalog Last Checked: October 02, 2026 at 07:51 PM -
The NIST Database for the Simulation of Electron Spectra for Surface Analysis (SESSA) can be used to simulate Auger-electron spectra and X-ray photoelectron spectra of nanostructures such as...
Search relevance: 1.00 | Views last month: 0 | Catalog Last Checked: October 02, 2026 at 07:51 PM -
NIST X-ray Photoelectron Spectroscopy Database XPS contains over 33,000 data records that can be used for the identification of unknown lines, retrieval of data for selected elements (binding...
Search relevance: 1.00 | Views last month: 0 | Catalog Last Checked: October 02, 2026 at 07:51 PM -
**** Note that this SRD is superseded by SRD 64 Version 4.0. **** The NIST Electron Elastic-Scattering Cross-Section Database provides values of differential elastic-scattering cross sections,...
Search relevance: 1.00 | Views last month: 0 | Catalog Last Checked: October 02, 2026 at 07:51 PM
