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• Organization: National Institute of Standards and Technology
• Dataset Last Updated: June 08, 2023

Data published in paper "Microstrip and Grounded CPW Calibration Kit Comparison for On-Wafer Transistor Characterization from 220 GHz to 325 GHz" We investigated the effect of two uncertainty...

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• Organization: National Institute of Standards and Technology
• Dataset Last Updated: July 09, 2024

This dataset contains the simulated and calibrated measured scattering parameters (S-parameters) of a via, a short-circuit manifold test structure, a single heterojunction bipolar transistor (HBT)...

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