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• Organization: National Institute of Standards and Technology
• Dataset Last Updated: December 01, 2010

The NIST Electron Inelastic-Mean-Free-Path Database provides values of electron inelastic mean free paths (IMFPs) principally for use in surface analysis by Auger-electron spectroscopy and X-ray...

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• Organization: National Institute of Standards and Technology
• Dataset Last Updated: October 10, 2012

NIST X-ray Photoelectron Spectroscopy Database XPS contains over 33,000 data records that can be used for the identification of unknown lines, retrieval of data for selected elements (binding...

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• Organization: National Institute of Standards and Technology
• Dataset Last Updated: January 01, 2011

The NIST Electron Effective Attenuation Length Database provides values of electron effective attenuation lengths (EALs) in materials at user-selected electron energies between 50 eV and 2,000 eV....

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