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The NIST Electron Inelastic-Mean-Free-Path Database provides values of electron inelastic mean free paths (IMFPs) principally for use in surface analysis by Auger-electron spectroscopy and X-ray...
Search relevance: 1.00 | Views last month: 4 | Catalog Last Checked: August 02, 2025 at 01:22 PM -
NIST X-ray Photoelectron Spectroscopy Database XPS contains over 33,000 data records that can be used for the identification of unknown lines, retrieval of data for selected elements (binding...
Search relevance: 1.00 | Views last month: 3 | Catalog Last Checked: August 02, 2025 at 01:22 PM -
Note that this SRD supersedes SRD 64 Version 3.2. The NIST Electron Elastic-Scattering Cross-Section Database provides values of differential elastic-scattering cross sections, total...
Search relevance: 1.00 | Views last month: 2 | Catalog Last Checked: August 02, 2025 at 01:59 PM -
**** Note that this SRD is superseded by SRD 64 Version 4.0. ****The NIST Electron Elastic-Scattering Cross-Section Database provides values of differential elastic-scattering cross sections,...
Search relevance: 1.00 | Views last month: 0 | Catalog Last Checked: August 02, 2025 at 01:22 PM -
The NIST Database for the Simulation of Electron Spectra for Surface Analysis (SESSA) can be used to simulate Auger-electron spectra and X-ray photoelectron spectra of nanostructures such as...
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The NIST Electron Effective Attenuation Length Database provides values of electron effective attenuation lengths (EALs) in materials at user-selected electron energies between 50 eV and 2,000 eV....
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This database provides values of backscattering correction factors (BCF) of homogeneous materials for quantitative surface analyses by Auger electron spectroscopy. These BCFs are obtained from...
Search relevance: 1.00 | Views last month: 0 | Catalog Last Checked: August 02, 2025 at 01:23 PM
