{
  "@type": "dcat:Dataset",
  "accessLevel": "public",
  "accrualPeriodicity": "irregular",
  "bureauCode": [
    "006:55"
  ],
  "contactPoint": {
    "fn": "Nate Orloff",
    "hasEmail": "mailto:nathan.orloff@nist.gov"
  },
  "description": "The data are measurements of test scattering parameter calibration data for on-wafer measurements from 10 MHz to 110 GHz. Data includes S-parameter data (Ref_Cs_g25_HF_0.s2p, Ref_Rs_g25_HF_0.s2p, Ref_L1_g25_HF_0.s2p, Ref_S1_g25_HF_0.s2p, Ref_Rg_g25_HF_0.s2p, Ref_Og_g25_HF_0.s2p, Ref_L2_g25_HF_0.s2p, Ref_L3_g25_HF_0.s2p, Ref_L4_g25_HF_0.s2p, Ref_L5_g25_HF_0.s2p, Ref_L6_g25_HF_0.s2p, Ref_L7_g25_HF_0.s2p, Ref_L8_g25_HF_0.s2p, Ref_L9_g25_HF_0.s2p). Data is in an *.s2p format. The format is \"# GHZ S RI R 50\". Frequency is GHz, data is S-parameters as real and imaginary pairs to a reference impedance of 50 Ohms. The effective permittivity data is a frequency real part of permittivity and imaginary part of permittivity. The effective permittivity data is a frequency real part of characteristic impedance and imaginary part of characteristic impedance.",
  "distribution": [
    {
      "description": "Data includes S-parameter data (Ref_Cs_g25_HF_0.s2p, Ref_Rs_g25_HF_0.s2p, Ref_L1_g25_HF_0.s2p, Ref_S1_g25_HF_0.s2p, Ref_Rg_g25_HF_0.s2p, Ref_Og_g25_HF_0.s2p, Ref_L2_g25_HF_0.s2p, Ref_L3_g25_HF_0.s2p, Ref_L4_g25_HF_0.s2p, Ref_L5_g25_HF_0.s2p, Ref_L6_g25_HF_0.s2p, Ref_L7_g25_HF_0.s2p, Ref_L8_g25_HF_0.s2p, Ref_L9_g25_HF_0.s2p). Data is in an *.s2p format. The format is \"# GHZ S RI R 50\". Frequency is GHz, data is S-parameters as real and imaginary pairs to a reference impedance of 50 Ohms. The effective permittivity data is a frequency real part of permittivity and imaginary part of permittivity. The effective permittivity data is a frequency real part of characteristic impedance and imaginary part of characteristic impedance.",
      "downloadURL": "https://data.nist.gov/od/ds/mds2-3404/V2.zip",
      "mediaType": "application/x-zip-compressed",
      "title": "Test S-parameter data for on-wafer calibrations from 10 MHz to 110 GHz"
    },
    {
      "downloadURL": "https://data.nist.gov/od/ds/mds2-3404/3404_README.txt",
      "mediaType": "text/plain"
    }
  ],
  "identifier": "ark:/88434/mds2-3404",
  "issued": "2024-08-26",
  "keyword": [
    "110 GHz",
    "Calnet",
    "S-parameter",
    "SOLT",
    "check standards",
    "impedance",
    "multiline TRL",
    "on-wafer",
    "probes",
    "propagation constant",
    "sapphire",
    "series resistor",
    "vector network analyzer"
  ],
  "landingPage": "https://data.nist.gov/od/id/mds2-3404",
  "language": [
    "en"
  ],
  "license": "https://www.nist.gov/open/license",
  "modified": "2024-07-10 00:00:00",
  "programCode": [
    "006:045"
  ],
  "publisher": {
    "@type": "org:Organization",
    "name": "National Institute of Standards and Technology"
  },
  "theme": [
    "Advanced Communications:Wireless (RF)",
    "Electronics:Electromagnetics",
    "Electronics:Semiconductors",
    "Metrology:Electrical/electromagnetic metrology"
  ],
  "title": "Test scattering parameter calibration data for on-wafer measurements from 10 MHz to 110 GHz - Calnet"
}