{
  "@type": "dcat:Dataset",
  "accessLevel": "public",
  "bureauCode": [
    "006:55"
  ],
  "contactPoint": {
    "fn": "Alain Rufenacht",
    "hasEmail": "mailto:alain.rufenacht@nist.gov"
  },
  "description": "This paper evaluates the performance of a new type of 2 V traveling cryocooled Programmable Josephson Voltage Standard for performing on-site verification of quantum voltage standards. Direct comparison with a 10 V system showed agreement of 8 parts in 10^11 at 2 V. This result shows that, despite the lower voltage, the direct Josephson-to-Josephson system comparison method provides a two orders-of-magnitude improvement over traveling Zener standards for verifying Josephson voltage standards.",
  "distribution": [
    {
      "description": "Figure 2 presents the voltage measured as a function of duration including three different dither current values and two bias configurations",
      "downloadURL": "https://data.nist.gov/od/ds/mds2-4086/Fig%202%20Comparison%20results%20at%202V.csv",
      "mediaType": "text/csv",
      "title": "Fig 2 Comparison results at 2V"
    },
    {
      "description": "Read me file, with description of the dataset.",
      "downloadURL": "https://data.nist.gov/od/ds/mds2-4086/4086_README.txt",
      "mediaType": "text/plain",
      "title": "4086_README.txt"
    }
  ],
  "identifier": "ark:/88434/mds2-4086",
  "issued": "2026-03-17",
  "keyword": [
    "Josephson junctions",
    "Measurement uncertainty",
    "Standards",
    "Superconducting integrated circuits",
    "Voltage measurement."
  ],
  "language": [
    "en"
  ],
  "license": "https://www.nist.gov/open/license",
  "modified": "2026-02-02 00:00:00",
  "programCode": [
    "006:045"
  ],
  "publisher": {
    "@type": "org:Organization",
    "name": "National Institute of Standards and Technology"
  },
  "theme": [
    "Metrology:Electrical/electromagnetic metrology"
  ],
  "title": "Compact 2 V Cryocooled Programmable Josephson Voltage Standard for Direct On-Site Quantum Voltage Comparisons"
}