{"@type": "dcat:Dataset", "accessLevel": "public", "accrualPeriodicity": "irregular", "bureauCode": ["006:55"], "contactPoint": {"fn": "Nick Jungwirth", "hasEmail": "mailto:nicholas.jungwirth@nist.gov"}, "description": "Included here are figures and other relevant data from the paper \"Characterizing Interconnects to 325 GHz\". Abstract: We developed an interconnect characterization procedure that first embeds the interconnect into the error boxes of a multiline thru-reflect-line calibration and subsequently de-embeds the interconnect with a multi-tiered calibration. We experimentally validated our method with distributed contactless interconnects in the form of broadside coupled coplanar waveguides as a test case. We find excellent agreement between experiment, full-wave simulations, and a distributed model of contactless interconnects. This work provides a rigorous method to accurately characterize interconnects when conventional approaches are not applicable.", "distribution": [{"description": "Data used to generate Figure 6 from \"Characterizing Interconnects to 325 GHz\".", "downloadURL": "https://data.nist.gov/od/ds/mds2-3079/Figure_6_Data.xlsx", "format": ".xlsx", "mediaType": "application/vnd.openxmlformats-officedocument.spreadsheetml.sheet", "title": "Figure_6_Data"}, {"description": "Data used to generate Figure 7 from \"Characterizing Interconnects to 325 GHz\".", "downloadURL": "https://data.nist.gov/od/ds/mds2-3079/Figure_7_Data.xlsx", "format": ".xlsx", "mediaType": "application/vnd.openxmlformats-officedocument.spreadsheetml.sheet", "title": "Figure_7_data"}, {"description": "This is a Readme file to help interpret \"Data for 'Characterizing Interconnects to 325 GHz' to be submitted to 'Transactions on Microwave Theory and Techniques\"'.", "downloadURL": "https://data.nist.gov/od/ds/mds2-3079/README.txt", "format": ".txt", "mediaType": "text/plain", "title": "Readme file for \"Data for 'Characterizing Interconnects to 325 GHz' to be submitted to 'Transactions on Microwave Theory and Techniques\"'"}], "identifier": "ark:/88434/mds2-3079", "issued": "2023-10-02", "keyword": ["broadside-coupled coplanar waveguide", "de-embedding", "distributed circuit model", "heterogeneous interconnect", "multiline TRL", "on-wafer calibration"], "landingPage": "https://data.nist.gov/od/id/mds2-3079", "language": ["en"], "license": "https://www.nist.gov/open/license", "modified": "2023-09-21 00:00:00", "programCode": ["006:045"], "publisher": {"@type": "org:Organization", "name": "National Institute of Standards and Technology"}, "theme": ["Electronics:Electromagnetics", "Metrology:Electrical/electromagnetic metrology"], "title": "Data for \"Characterizing Interconnects to 325 GHz\" to be submitted to \"Transactions on Microwave Theory and Techniques\""}