{"@type": "dcat:Dataset", "accessLevel": "public", "accrualPeriodicity": "irregular", "bureauCode": ["006:55"], "contactPoint": {"fn": "Nate Orloff", "hasEmail": "mailto:nathan.orloff@nist.gov"}, "description": "The data are measurements of test scattering parameter calibration data for on-wafer measurements from 10 MHz to 110 GHz. Data includes S-parameter data (Ref_Cs_g25_HF_0.s2p, Ref_Rs_g25_HF_0.s2p, Ref_L1_g25_HF_0.s2p, Ref_S1_g25_HF_0.s2p, Ref_Rg_g25_HF_0.s2p, Ref_Og_g25_HF_0.s2p, Ref_L2_g25_HF_0.s2p, Ref_L3_g25_HF_0.s2p, Ref_L4_g25_HF_0.s2p, Ref_L5_g25_HF_0.s2p, Ref_L6_g25_HF_0.s2p, Ref_L7_g25_HF_0.s2p, Ref_L8_g25_HF_0.s2p, Ref_L9_g25_HF_0.s2p). Data is in an *.s2p format. The format is \"# GHZ S RI R 50\". Frequency is GHz, data is S-parameters as real and imaginary pairs to a reference impedance of 50 Ohms. The effective permittivity data is a frequency real part of permittivity and imaginary part of permittivity. The effective permittivity data is a frequency real part of characteristic impedance and imaginary part of characteristic impedance.", "distribution": [{"description": "Data includes S-parameter data (Ref_Cs_g25_HF_0.s2p, Ref_Rs_g25_HF_0.s2p, Ref_L1_g25_HF_0.s2p, Ref_S1_g25_HF_0.s2p, Ref_Rg_g25_HF_0.s2p, Ref_Og_g25_HF_0.s2p, Ref_L2_g25_HF_0.s2p, Ref_L3_g25_HF_0.s2p, Ref_L4_g25_HF_0.s2p, Ref_L5_g25_HF_0.s2p, Ref_L6_g25_HF_0.s2p, Ref_L7_g25_HF_0.s2p, Ref_L8_g25_HF_0.s2p, Ref_L9_g25_HF_0.s2p). Data is in an *.s2p format. The format is \"# GHZ S RI R 50\". Frequency is GHz, data is S-parameters as real and imaginary pairs to a reference impedance of 50 Ohms. The effective permittivity data is a frequency real part of permittivity and imaginary part of permittivity. The effective permittivity data is a frequency real part of characteristic impedance and imaginary part of characteristic impedance.", "downloadURL": "https://data.nist.gov/od/ds/mds2-3404/V2.zip", "mediaType": "application/x-zip-compressed", "title": "Test S-parameter data for on-wafer calibrations from 10 MHz to 110 GHz"}, {"downloadURL": "https://data.nist.gov/od/ds/mds2-3404/3404_README.txt", "mediaType": "text/plain"}], "identifier": "ark:/88434/mds2-3404", "issued": "2024-08-26", "keyword": ["110 GHz", "Calnet", "S-parameter", "SOLT", "check standards", "impedance", "multiline TRL", "on-wafer", "probes", "propagation constant", "sapphire", "series resistor", "vector network analyzer"], "landingPage": "https://data.nist.gov/od/id/mds2-3404", "language": ["en"], "license": "https://www.nist.gov/open/license", "modified": "2024-07-10 00:00:00", "programCode": ["006:045"], "publisher": {"@type": "org:Organization", "name": "National Institute of Standards and Technology"}, "theme": ["Advanced Communications:Wireless (RF)", "Electronics:Electromagnetics", "Electronics:Semiconductors", "Metrology:Electrical/electromagnetic metrology"], "title": "Test scattering parameter calibration data for on-wafer measurements from 10 MHz to 110 GHz - Calnet"}