{
  "@type": "dcat:Dataset",
  "accessLevel": "public",
  "bureauCode": [
    "006:55"
  ],
  "contactPoint": {
    "fn": "James Cline",
    "hasEmail": "mailto:srms@nist.gov"
  },
  "description": "The data from this instrument consists of sets of measurements of Xray intensity as a function of diffraction angle.  Almost all of it is collected using a position-sensitive detector (PSD), and is stored in CIF format.",
  "distribution": [
    {
      "accessURL": "https://doi.org/10.18434/M32251",
      "title": "DOI Access for Diffraction Data for SRM 640f"
    },
    {
      "description": "X-ray diffraction data expressed as intensity as a function of angle",
      "downloadURL": "https://data.nist.gov/od/ds/mds2-2251/srm640f_cifs_20200601a.zip",
      "mediaType": "application/x-zip-compressed",
      "title": "Diffraction Data for SRM 640f"
    },
    {
      "downloadURL": "https://data.nist.gov/od/ds/mds2-2251/srm640f_cifs_20200601a.zip.sha256",
      "mediaType": "text/plain",
      "title": "SHA256 File for Diffraction Data for SRM 640f"
    }
  ],
  "identifier": "ark:/88434/mds2-2251",
  "issued": "2020-06-22",
  "keyword": [
    "Xray Powder Diffraction; Diverging Beam Diffractometer; Powder Diffraction SRM"
  ],
  "landingPage": "https://data.nist.gov/od/id/mds2-2251",
  "language": [
    "en"
  ],
  "license": "https://www.nist.gov/open/license",
  "modified": "2020-06-01 00:00:00",
  "programCode": [
    "006:045"
  ],
  "publisher": {
    "@type": "org:Organization",
    "name": "National Institute of Standards and Technology"
  },
  "theme": [
    "Materials:Materials characterization"
  ],
  "title": "Diffraction Data for SRM 640f"
}