{"@type": "dcat:Dataset", "accessLevel": "public", "accrualPeriodicity": "irregular", "bureauCode": ["026:00"], "contactPoint": {"@type": "vcard:Contact", "fn": "SCOTT POLL", "hasEmail": "mailto:scott.d.poll@nasa.gov"}, "description": "This paper presents a new sensing application\r\nto diagnose power semiconductor aging in power drive\r\nsystems. It has been shown previously that device\r\nparasitic characteristics change during the aging process\r\nwhich results in detectable changes in their frequency\r\nresponse. This change is manifested in the current signal\r\nat very high frequencies. Therefore, using a wideband\r\nAC current sensor, high frequency components of the\r\ncurrent can be acquired, providing a way to detect\r\ndevice aging.", "distribution": [{"@type": "dcat:Distribution", "description": "2012IEEE_Ali_NewSensingPowerSemiconductor.pdf", "downloadURL": "https://c3.nasa.gov/dashlink/static/media/publication/2012IEEE_Ali_NewSensingPowerSemiconductor.pdf", "format": "PDF", "mediaType": "application/pdf", "title": "2012IEEE_Ali_NewSensingPowerSemiconductor.pdf"}], "identifier": "DASHLINK_870", "issued": "2013-12-19", "keyword": ["ames", "dashlink", "nasa"], "landingPage": "https://c3.nasa.gov/dashlink/resources/870/", "modified": "2025-03-31", "programCode": ["026:029"], "publisher": {"@type": "org:Organization", "name": "Dashlink"}, "title": "New Sensing Application to Diagnose Power Semiconductor Aging in Actuator Power Drive Systems"}