{"@type": "dcat:Dataset", "accessLevel": "public", "bureauCode": ["026:00"], "contactPoint": {"@type": "vcard:Contact", "fn": "Chetan Kulkarni", "hasEmail": "mailto:chetan.s.kulkarni@nasa.gov"}, "description": "Data from capacitors subjected to electrical stress at 10V.", "distribution": [{"@type": "dcat:Distribution", "downloadURL": "https://data.nasa.gov/docs/legacy/EOS_DataSet.zip", "format": "ZIP", "mediaType": "application/zip", "title": "EOS_DataSet.zip"}], "identifier": "https://data.nasa.gov/api/views/y939-maf8", "issued": "2023-11-02", "keyword": ["degradation", "diagnostics", "electronics", "phm", "prognostics"], "landingPage": "https://data.nasa.gov/dataset/capacitor-electrical-stress-2", "license": "https://www.usa.gov/government-works", "modified": "2025-05-29", "programCode": ["026:001"], "publisher": {"@type": "org:Organization", "name": "PCoE"}, "theme": ["Raw Data"], "title": "Capacitor Electrical Stress-2"}