{"@type": "dcat:Dataset", "accessLevel": "public", "bureauCode": ["006:55"], "contactPoint": {"fn": "Alain Rufenacht", "hasEmail": "mailto:alain.rufenacht@nist.gov"}, "description": "This paper evaluates the performance of a new type of 2 V traveling cryocooled Programmable Josephson Voltage Standard for performing on-site verification of quantum voltage standards. Direct comparison with a 10 V system showed agreement of 8 parts in 10^11 at 2 V. This result shows that, despite the lower voltage, the direct Josephson-to-Josephson system comparison method provides a two orders-of-magnitude improvement over traveling Zener standards for verifying Josephson voltage standards.", "distribution": [{"description": "Figure 2 presents the voltage measured as a function of duration including three different dither current values and two bias configurations", "downloadURL": "https://data.nist.gov/od/ds/mds2-4086/Fig%202%20Comparison%20results%20at%202V.csv", "mediaType": "text/csv", "title": "Fig 2 Comparison results at 2V"}, {"description": "Read me file, with description of the dataset.", "downloadURL": "https://data.nist.gov/od/ds/mds2-4086/4086_README.txt", "mediaType": "text/plain", "title": "4086_README.txt"}], "identifier": "ark:/88434/mds2-4086", "issued": "2026-03-17", "keyword": ["Josephson junctions", "Measurement uncertainty", "Standards", "Superconducting integrated circuits", "Voltage measurement."], "language": ["en"], "license": "https://www.nist.gov/open/license", "modified": "2026-02-02 00:00:00", "programCode": ["006:045"], "publisher": {"@type": "org:Organization", "name": "National Institute of Standards and Technology"}, "theme": ["Metrology:Electrical/electromagnetic metrology"], "title": "Compact 2 V Cryocooled Programmable Josephson Voltage Standard for Direct On-Site Quantum Voltage Comparisons"}