{"@type": "dcat:Dataset", "accessLevel": "public", "accrualPeriodicity": "irregular", "bureauCode": ["026:00"], "contactPoint": {"@type": "vcard:Contact", "fn": "Nikunj Oza", "hasEmail": "mailto:Nikunj.C.Oza@nasa.gov"}, "description": "Preliminary data from thermal overstress accelerated aging using the aging and characterization system. The data set contains aging data from 6 devices, one device aged with DC gate bias and the rest aged with a squared signal gate bias. Several variables are recorded and in some cases, high-speed measurements of gate voltage, collector-emitter voltage and collector current are available. The data set is provided by the Prognostics CoE at NASA Ames.", "identifier": "DASHLINK_134", "issued": "2010-09-13", "keyword": ["ames", "dashlink", "nasa"], "landingPage": "https://c3.nasa.gov/dashlink/resources/134/", "modified": "2025-07-17", "programCode": ["026:029"], "publisher": {"@type": "org:Organization", "name": "Dashlink"}, "title": "IGBT accelerated aging data set."}