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Federal
Supporting Data for Selected Area Electron Beam Induced Deposition of Pt and W for EBSD Backgrounds
National Institute of Standards and Technology —
These are the unprocessed electron back scatter diffraction patterns (EBSPs) collected from the mesas of electron beam induced deposition (EBID) material, in addition... -
Federal
Simulating Photon Echoes for Quantum Memory
National Institute of Standards and Technology —
A Wolfram Demonstration Template has been specialized to a model of a semiclassical model of photon echoes. An incident Gaussian pulse propagates through a material... -
Federal
OptSortSph: Sorting Spherical Dielectric Particles in a Standing-Wave Interference Field
National Institute of Standards and Technology —
Software to predict the optical sorting of particles in a standing-wave laser interference field -
Federal
Supplementary data for "Distributions of fitness effects for amino acid changes from high-throughout mutagenesis experiments" (McCandlish and Stoltzfus, 2018)
National Institute of Standards and Technology —
McCandlish and Stoltzfus gathered data from deep mutational scanning experiments on 12 proteins, comprising 56641 distinct amino acid replacement mutations. By... -
Federal
Calibration Data for Wafer 2 of SRM 3461 - MEMS Cantilever Stiffness
National Institute of Standards and Technology —
SRM 3461 is an AFM sized chip with an array of seven cantilevers on each chip. The uniformity of the chips offered for sale from wafer 2 is excellent and the SRM...