Metadata Updated: March 8, 2017

The Tandem Van de Graaff facility provides researchers with beams of more than 40 different types of ions - atoms that have been stripped of their electrons. One of the new and interesting applications available at the Tandem is the testing of integrated circuit chips under heavy ion bombardment. By simulating the effects of radiation both in space and on the ground, scientists and engineers are improving the reliability of computers.

Access & Use Information

Public: This dataset is intended for public access and use. License: No license information was provided. If this work was prepared by an officer or employee of the United States government as part of that person's official duties it is considered a U.S. Government Work.

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Metadata Created Date March 8, 2017
Metadata Updated Date March 8, 2017

Metadata Source

Harvested from Federal Laboratory Consortium Data.json

Additional Metadata

Resource Type Dataset
Metadata Created Date March 8, 2017
Metadata Updated Date March 8, 2017
Publisher Federal Laboratory Consortium
Unique Identifier AA4C73C1-00E0-4A82-9FF3-905D30ABE55F
Maintainer Email
Public Access Level public
Address1 Brookhaven National Lab
Metadata Context https://project-open-data.cio.gov/v1.1/schema/catalog.jsonld
Schema Version https://project-open-data.cio.gov/v1.1/schema
Catalog Describedby https://project-open-data.cio.gov/v1.1/schema/catalog.json
Expertise Capabilities:Many different ion speciesWide range of energiesWide range of intensitiesHigh beam qualityAccurately known beamcharacteristicsReliable operationUser friendly environment
Flcbusinessurl https://flcbusiness.federallabs.org/#/laboratory/3227
Harvest Object Id 500c17f8-240b-4d6e-8685-34ac17cd8a04
Harvest Source Id 5859cfed-553c-48de-a478-b67b5225f6fc
Harvest Source Title Federal Laboratory Consortium Data.json
Phone (631) 344-4619
Postalcode 11973
Repphone (631) 344-4619
Sizesqft 0
Source Datajson Identifier True
Source Hash 7e5748a0382b61c5439ea52e58174bcbec875b4e
Source Schema Version 1.1
Statecode NY

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