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Supplementary data from the NIST lattice comparator associated with paper "The NIST Silicon Lattice Comparator Upgrade"

Metadata Updated: March 18, 2023

The data from this instrument consists of sets of measurements of Xray intensity as a function of diffraction angle. All of it is collected and is stored in JSON files. The files are highly self-descriptive of their content, and contain angles, intensities, temperatures, and other environmental parameters, along with metadata.

Access & Use Information

Public: This dataset is intended for public access and use. License: See this page for license information.

Downloads & Resources


Metadata Created Date March 18, 2023
Metadata Updated Date March 18, 2023
Data Update Frequency irregular

Metadata Source

Harvested from NIST

Additional Metadata

Resource Type Dataset
Metadata Created Date March 18, 2023
Metadata Updated Date March 18, 2023
Publisher National Institute of Standards and Technology
Identifier ark:/88434/mds2-2913
Data First Published 2023-03-10
Language en
Data Last Modified 2023-01-18 00:00:00
Category Materials:Materials characterization, Standards:Reference materials, Standards:Reference data
Public Access Level public
Data Update Frequency irregular
Bureau Code 006:55
Metadata Context
Schema Version
Catalog Describedby
Harvest Object Id 11ff0fc9-d6d0-4d18-a3b7-d2e97df790a1
Harvest Source Id 74e175d9-66b3-4323-ac98-e2a90eeb93c0
Harvest Source Title NIST
Homepage URL
Program Code 006:045
Source Datajson Identifier True
Source Hash b97ae915d7011bc432f7f8cd446dec9e01f92f6c
Source Schema Version 1.1

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