Spectroscopic Ellipsometer: Woollam M-2000

Metadata Updated: March 8, 2017

Description:This system is used to measure thin fils properties (thickness and refractive index)Scientific Opportunities / Applications:Thin film characterizationMeasures thickness, optical constants on single or multi-layer stacks

Access & Use Information

Public: This dataset is intended for public access and use. License: No license information was provided. If this work was prepared by an officer or employee of the United States government as part of that person's official duties it is considered a U.S. Government Work.

Downloads & Resources

No file downloads have been provided. The publisher may provide downloads in the future or they may be available from their other links.

Dates

Metadata Created Date March 8, 2017
Metadata Updated Date March 8, 2017

Metadata Source

Harvested from Federal Laboratory Consortium Data.json

Additional Metadata

Resource Type Dataset
Metadata Created Date March 8, 2017
Metadata Updated Date March 8, 2017
Publisher Federal Laboratory Consortium
Unique Identifier 256EDEA4-A209-468A-BBA1-6380EE88B922
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Schema Version https://project-open-data.cio.gov/v1.1/schema
Catalog Describedby https://project-open-data.cio.gov/v1.1/schema/catalog.json
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Flcbusinessurl https://flcbusiness.federallabs.org/#/laboratory/5696
Harvest Object Id 201572b4-0b26-4ad2-8bb4-10ed5ed926a0
Harvest Source Id 5859cfed-553c-48de-a478-b67b5225f6fc
Harvest Source Title Federal Laboratory Consortium Data.json
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Source Datajson Identifier True
Source Hash c98fb4d9a33b11cc09831d07caed0e72fe7b1770
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