Space Qualified, Radiation Hardened, Dense Monolithic Flash Memory, Phase II

Metadata Updated: May 2, 2019

Space Micro proposes to build a radiation hardened by design (RHBD) flash memory, using a modified version of our RH-eDRAM Memory Controller to solve all the single event effects issues (SEU, SEFI and multiple bit errors) using either a RHBD process with NAND Flash cells. The RH-eFlash will be manufactured on known radiation characterized ASIC processes: examples being 130 nm or 65 nm TSMC or other US foundry equivalents. Using the TSMC example, the resulting RH-eFlash, fabricated on a 65 nm process, provides 512 Mbit to 1 Gbit of radiation hardened (SEU, SEFI, SEL and TID) NAND Flash memory. Operating temperature and packaging reliability is addressed through a thorough memory integrated circuit design (temperature) and post IC high-reliability package selections (i.e. ceramic packages). Note that this technology is portable to future available and radiation tested ASIC processes with even finer geometries and high density.

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Public: This dataset is intended for public access and use. License: U.S. Government Work

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Metadata Created Date August 1, 2018
Metadata Updated Date May 2, 2019

Metadata Source

Harvested from NASA Data.json

Additional Metadata

Resource Type Dataset
Metadata Created Date August 1, 2018
Metadata Updated Date May 2, 2019
Publisher Space Technology Mission Directorate
Unique Identifier TECHPORT_8820
Maintainer Email
Public Access Level public
Bureau Code 026:00
Metadata Context
Metadata Catalog ID
Schema Version
Catalog Describedby
Datagov Dedupe Retained 20190501230127
Harvest Object Id 5aa7f983-249b-4f17-b1c9-1dab906b99b6
Harvest Source Id 39e4ad2a-47ca-4507-8258-852babd0fd99
Harvest Source Title NASA Data.json
Data First Published 2013-10-01
Homepage URL
Data Last Modified 2018-07-19
Program Code 026:027
Source Datajson Identifier True
Source Hash bc9b6fb54b9901b10b3fdb6c98e6dc240f2b1de4
Source Schema Version 1.1

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