Semiconductor Laser Measurements Laboratory

Metadata Updated: March 8, 2017

The Semiconductor Laser Measurements Laboratory is equipped to investigate and characterize the lasing properties of semiconductor diode lasers. Lasing features such as wavelength, spectral mode, spatial mode, polarization, and recombination kinetics can all be measured and quantified. Ultrafast spectroscopy and L-I measurements can be made as well as broadband and narrowband reflectance measurements. Laboratory equipment includes a 18 Watt Nd:YVO4 laser pumping a Ti:Sapphire oscillator and a synch-pumped Optical Parametric Oscillator capable of tunable operation from the visible (0.5 microns) to infrared (1.6 microns) with 100 femtosecond pulsewidth at 76 MHz repetition rate. In addition, the 2nd and 3rd harmonics of the oscillator are also available at 0.266 and 0.4 microns, respectively. This system can be used in conjunction with a synchronized streak camera with picosecond temporal resolution, a dye laser, a Ti-Sapphire femtosecond laser, several monochromators, an optical multichannel analyzer, a laser diode power supply as well as the necessary optical components, coolers, power meters and optical table to perform these measurements.

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Public: This dataset is intended for public access and use. License: No license information was provided. If this work was prepared by an officer or employee of the United States government as part of that person's official duties it is considered a U.S. Government Work.

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Metadata Created Date March 8, 2017
Metadata Updated Date March 8, 2017

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Harvested from Federal Laboratory Consortium Data.json

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Resource Type Dataset
Metadata Created Date March 8, 2017
Metadata Updated Date March 8, 2017
Publisher Federal Laboratory Consortium
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