Semiconductor Electrical Measurements Laboratory

Metadata Updated: March 8, 2017

The Semiconductor Electrical Measurements Laboratory is a research laboratory which complements the Optical Measurements Laboratory. The laboratory provides for Hall Effect and Deep Level Transient Spectroscopy (DLTS) measurements. These electrical measurements provide information about semiconductor properties not available from the optical measurements but essential to the characterization of any solid state or semiconductor device. The laboratory contains a complete Hall Effect measurement system with both low and high temperature attachments, a deep level transient spectroscopy system, annealing furnaces, crystal scriber, and data analysis equipment. Both the Hall and DLTS systems are fully automated with samples mounted on a cold finger of a closed cycle cryogenic refrigerator system. Recent additions to this laboratory provide the capability to study a wide range of semiconductor devices such as diodes, transistors, and fully characterize metal-oxide-semiconductor devices. These additions include a state-of-the-art HP4155 semiconductor parameter analyzer, a frequency tunable capacitance bridge, both connected to a semi-automatic probe station, as well as metallization equipment and a surface profilometer.

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Public: This dataset is intended for public access and use. License: No license information was provided. If this work was prepared by an officer or employee of the United States government as part of that person's official duties it is considered a U.S. Government Work.

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Metadata Created Date March 8, 2017
Metadata Updated Date March 8, 2017

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Harvested from Federal Laboratory Consortium Data.json

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Resource Type Dataset
Metadata Created Date March 8, 2017
Metadata Updated Date March 8, 2017
Publisher Federal Laboratory Consortium
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Maintainer Email
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