Scanning Electron Microscope Analysis System

Metadata Updated: March 8, 2017

This facility provides the capability to examine surfaces microscopically with high resolution (5 nanometers), perform micro chemical analyses of these surfaces, and obtain quantitative image information digitally. The system has been used for identifying the material aspects of the design and failure of armament items and components.

Access & Use Information

Public: This dataset is intended for public access and use. License: No license information was provided. If this work was prepared by an officer or employee of the United States government as part of that person's official duties it is considered a U.S. Government Work.

Downloads & Resources

No file downloads have been provided. The publisher may provide downloads in the future or they may be available from their other links.

Dates

Metadata Created Date March 8, 2017
Metadata Updated Date March 8, 2017

Metadata Source

Harvested from Federal Laboratory Consortium Data.json

Additional Metadata

Resource Type Dataset
Metadata Created Date March 8, 2017
Metadata Updated Date March 8, 2017
Publisher Federal Laboratory Consortium
Unique Identifier C48DB0B2-A518-4AFD-B61E-38DFB9282DF4
Maintainer
Maintainer Email
None
Public Access Level public
Address1 RDAR-EIB
Address2
Address3
Metadata Context https://project-open-data.cio.gov/v1.1/schema/catalog.jsonld
Schema Version https://project-open-data.cio.gov/v1.1/schema
Catalog Describedby https://project-open-data.cio.gov/v1.1/schema/catalog.json
Expertise
Fax
Flcbusinessurl https://flcbusiness.federallabs.org/#/laboratory/3567
Harvest Object Id e007c054-325c-41bf-96a2-853b8f9c1ae1
Harvest Source Id 5859cfed-553c-48de-a478-b67b5225f6fc
Harvest Source Title Federal Laboratory Consortium Data.json
Mission
Owneroperatorcode
Phone 9737244875
Postalcode 07806-5000
Repphone 9737244875
Sizesqft 0
Source Datajson Identifier True
Source Hash a5d411ffb5df12ae9542b98373e0d5c0e7c9c267
Source Schema Version 1.1
Statecode NJ
T2Website

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