Scanning Auger Electron Microscope

Metadata Updated: March 8, 2017

A JEOL model 7830F field emission source, scanning Auger microscope.Specifications / Capabilities:Ultra-high vacuum (UHV), electron gun range from 0.1 kV to 25 kV, hemispherical electron energy analyzer (0 keV to 3 keV), two-stage sample introduction, parking stage, backscattered electron detector, energy dispersive x-ray detector, Parallax UHV WDS (under development), 3 kV Ar ion gun, and non-monochromated Al and Mg x-ray sources. Capable of chemical and compositional analysis at the nanoscale, depth profiles, line profiles, and compositional mapping.

Access & Use Information

Public: This dataset is intended for public access and use. License: No license information was provided. If this work was prepared by an officer or employee of the United States government as part of that person's official duties it is considered a U.S. Government Work.

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Metadata Created Date March 8, 2017
Metadata Updated Date March 8, 2017

Metadata Source

Harvested from Federal Laboratory Consortium Data.json

Additional Metadata

Resource Type Dataset
Metadata Created Date March 8, 2017
Metadata Updated Date March 8, 2017
Publisher Federal Laboratory Consortium
Unique Identifier 1F457CA8-221E-49B0-8EFC-3CCD34A3710E
Doug Meier
Maintainer Email
Public Access Level public
Address1 100 Bureau Drive
Metadata Context
Schema Version
Catalog Describedby
Harvest Object Id 0a3ce760-39f4-4cc7-bd9b-af6e6bde5e29
Harvest Source Id 5859cfed-553c-48de-a478-b67b5225f6fc
Harvest Source Title Federal Laboratory Consortium Data.json
Postalcode 20899
Repphone 301-975-4619
Sizesqft 0
Source Datajson Identifier True
Source Hash 2fa23faff76900b9db11e05b87478a5e0d28ec34
Source Schema Version 1.1
Statecode MD

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