Real-Time Geometric Analysis of Additive Manufacturing, Phase I

Metadata Updated: November 12, 2020

Current selective laser melting additive manufacturing (AM) systems do not have adequate process control features for wide-spread adoption across NASA. In this project Mound Laser & Photonics Center (MLPC) will work with Wright State University (WSU) to implement a novel system for layer-by-layer in-process monitoring for AM. The key innovation in this work will be the use of a line-laser profilometer (LLP) for 3-dimensional, in situ, sub-micron profilometry on every layer during an AM process, both before and after the layer has been melted. Several advantages will be gained from this approach: (1) Measurements on the spread powder layers will determine powder distribution and quality, enabling correlation between powder distribution and finished part material properties such as microstructure and density; (2) Measurements on the melted layer profile will determine the geometric accuracy of the melted layer (both in depth and lateral dimensions), compared to the CAD file, and allow correlations between geometric accuracy to powder distribution, laser parameters, and material properties; and (3) simple layer defects will be easily identified before the next layer is spread. This technology could enable real-time process qualification, and eventually automatic powder re-spreading or layer re-melting to fix defects in the layer. In this project, the SBC (MLPC) will build test coupons in their custom-built, fully tunable, research-grade AM testbed and monitor the build process with the LLP. The RI (WSU), who has tremendous expertise in AM sample characterization, will then perform in-depth material analysis on the test coupons to determine material properties. At the time of this proprosal, MLPC has already determined that the LLP can measure the AM testbed with micron-scale accuracy. Therefore, achieving success with this approach is very likely, the primary needs for implementation are the development of experimental methods and process control correlations.

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Public: This dataset is intended for public access and use. License: No license information was provided. If this work was prepared by an officer or employee of the United States government as part of that person's official duties it is considered a U.S. Government Work.

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Dates

Metadata Created Date November 12, 2020
Metadata Updated Date November 12, 2020

Metadata Source

Harvested from NASA Data.json

Additional Metadata

Resource Type Dataset
Metadata Created Date November 12, 2020
Metadata Updated Date November 12, 2020
Publisher Space Technology Mission Directorate
Unique Identifier Unknown
Maintainer
Identifier TECHPORT_33633
Data First Published 2016-06-01
Data Last Modified 2020-01-29
Public Access Level public
Bureau Code 026:00
Metadata Context https://project-open-data.cio.gov/v1.1/schema/catalog.jsonld
Metadata Catalog ID https://data.nasa.gov/data.json
Schema Version https://project-open-data.cio.gov/v1.1/schema
Catalog Describedby https://project-open-data.cio.gov/v1.1/schema/catalog.json
Homepage URL https://techport.nasa.gov/view/33633
Program Code 026:027
Source Datajson Identifier True
Source Hash e9b6786333a1e0632260d7b701fc2b43724d80b6
Source Schema Version 1.1

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