NIST NIST Backscattering-Correction-Factor Database for Auger Electron Spectroscopy - SRD 154

Metadata Updated: December 5, 2019

This database provides values of backscattering correction factors (BCF) of homogeneous materials for quantitative surface analyses by Auger electron spectroscopy. These BCFs are obtained from Monte Carlo simulations based on two models of electron transport in the material, a simplified model and an advanced model [A. Jablonski and C. J. Powell, Surf. Science 604, 1928 (2010)]. One assumption for the former model is that the primary-electron beam is unchanged, in intensity, energy or direction, within the information depth for Auger-electron emission. This assumption becomes progressively less useful as the primary energy becomes closer to the core-level ionization energy for the relevant Auger transition or for increasing angles of incidence of the primary electrons.

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Public: This dataset is intended for public access and use. License: See this page for license information.

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Metadata Created Date January 29, 2016
Metadata Updated Date December 5, 2019
Data Update Frequency irregular

Metadata Source

Harvested from Commerce Non Spatial Data.json Harvest Source

Additional Metadata

Resource Type Dataset
Metadata Created Date January 29, 2016
Metadata Updated Date December 5, 2019
Publisher National Institute of Standards and Technology
Unique Identifier ECBCC1C1300B2ED9E04306570681B10717
Cedric J. Powell
Maintainer Email
Public Access Level public
Data Update Frequency irregular
Bureau Code 006:55
Metadata Context
Schema Version
Catalog Describedby
Harvest Object Id ae4d473f-4548-441b-9258-634981052aa9
Harvest Source Id 0836a94a-b3c8-4190-a145-bddc06458b2c
Harvest Source Title Commerce Non Spatial Data.json Harvest Source
Homepage URL
Language en
Data Last Modified 2015-07-01 00:00:00
Program Code 006:052
Related Documents,
Source Datajson Identifier True
Source Hash bfc1415ae7ce4464f9445daeff309f288734717a
Source Schema Version 1.1
Category Standards:Reference data

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