Nanometer Characterization/Manipulation Facility

Metadata Updated: March 8, 2017

FUNCTION: Characterizes the nanometer scale of biological, chemical, physical, electronic, and mechanical properties of surfaces and thin films using scanning probe microscopies/spectroscopies, and a variety of complementary surface analysis techniques. The limits of materials miniaturization are explored by using the new microscopes to fabricate and manipulate surface structures of nanometer size. This technology is used to investigate new chemical, biological, and magnetic sensors, electronic devices, and nanoscale materials.DESCRIPTION: Scanning tunneling microscopy/spectroscopy enables observation of the surface topography, chemical reactivity, and electronic structure of conductive substrates with atomic-scale resolution. The atomic force microscope (AFM) provides nanometer-scale resolution of surface topography, mechanical properties, and tip-surface interaction forces on both conductive and insulating substrates. The tip-surface interaction forces, including frictional forces, can be measured with nanonewton (single chemical bond) precision. An ultra-high-vacuum (UHV) system for nanomanipulation and nanoprobe characterization is also available in the Nanoscience Research Laboratory.INSTRUMENTATION: NRL-built UHV scanning tunneling microscope/spectroscope (STM/S) with facilities for low-energy electron diffraction (LEED) and Auger electron spectroscopy (AES); Omicron UHV variable temperature STM/AFM integrated with a second UHV system housing a multi-tip STM with a scanning electron microscope (5 nm resolution) and scanning Auger microprobe; Park Scientific Instruments AutoProbe UHV STM/AFM integrated with the NRL Molecular Beam Epitaxy (MBE) Epicenter for characterizing semiconductor surfaces following MBE, including cross-sectional STM; Nanoscope IIIa multimode AFM (lateral force, magnetic force, and tapping modes) equipped with breakout box and force-volume mapping system; TM Microscopes Autoprobe CP AFM used for dip pen nanolithography; Digital Instruments Bioscope AFM integrated with a Zeiss Axiovert 100 inverted optical microscope with fluorescence, micromanipulation, and microinjection capabilities; and Nanoscope IIIa and Multimode AFM, NRL-built lateralforce microscope, and Hysitron scanningnanoindenters (Triboscope and Bioindenter) with commercial and custom software to measure surface mechanical properties.

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Public: This dataset is intended for public access and use. License: No license information was provided. If this work was prepared by an officer or employee of the United States government as part of that person's official duties it is considered a U.S. Government Work.

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Metadata Created Date March 8, 2017
Metadata Updated Date March 8, 2017

Metadata Source

Harvested from Federal Laboratory Consortium Data.json

Additional Metadata

Resource Type Dataset
Metadata Created Date March 8, 2017
Metadata Updated Date March 8, 2017
Publisher Federal Laboratory Consortium
Unique Identifier A8347EEC-65C5-4D93-9BEF-D4658A869678
Maintainer Email
Public Access Level public
Address1 4555 Overlook Avenue S.W.
Metadata Context
Schema Version
Catalog Describedby
Harvest Object Id 83c4b2ce-3c4e-4484-8664-1e2df85b367d
Harvest Source Id 5859cfed-553c-48de-a478-b67b5225f6fc
Harvest Source Title Federal Laboratory Consortium Data.json
Phone 202-767-3083
Postalcode 20375
Repphone (202) 767-2519
Sizesqft 0
Source Datajson Identifier True
Source Hash 6602943123a852db986e3601da8800948b885ae7
Source Schema Version 1.1
Statecode DC

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