High Speed On-Wafer Characterization Laboratory

Metadata Updated: March 8, 2017

At the High Speed On-Wafer Characterization Laboratory, researchers characterize and model devices operating at terahertz (THz) and millimeter-wave frequencies. The facility is unique in its ability to perform nonlinear device characterization, including state-of-the-art load pull and arbitrary digital waveform synthesis, making this the only laboratory DoD-wide where actual mil waveforms are tested directly on-wafer. Additionally, the capability to test at high power while controlling temperature enables the design of high power linear sources and expands the range of performance at the integrated circuit (chip) level.

Access & Use Information

Public: This dataset is intended for public access and use. License: No license information was provided. If this work was prepared by an officer or employee of the United States government as part of that person's official duties it is considered a U.S. Government Work.

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Dates

Metadata Created Date March 8, 2017
Metadata Updated Date March 8, 2017

Metadata Source

Harvested from Federal Laboratory Consortium Data.json

Additional Metadata

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Metadata Created Date March 8, 2017
Metadata Updated Date March 8, 2017
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