Electronics and Telemetry Engineering and Test Facility

Metadata Updated: March 8, 2017

The Electronics Laboratory is a fully equipped facility providing the capability to support electronic product development from highly complex weapon system sensors, mine electronics and electronic warfare equipment to simple electronic devices. Experienced laboratory personnel provide design, fabrication, test, evaluation, troubleshooting and failure analysis assistance for any type of electronic system, subsystem or component. In addition to a full complement of instrumentation, environmental test equipment and a prototype machine shop, the laboratory has a variety of software for design, simulation and analysis of electronic circuits through the media of computer aided design/engineering (CAD/CAE). The laboratory and its personnel are an ideal source of electronic [HTML_REMOVED]know how[HTML_REMOVED] for small and medium businesses seeking assistance in electronic product development.

Access & Use Information

Public: This dataset is intended for public access and use. License: No license information was provided. If this work was prepared by an officer or employee of the United States government as part of that person's official duties it is considered a U.S. Government Work.

Downloads & Resources

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Metadata Created Date March 8, 2017
Metadata Updated Date March 8, 2017

Metadata Source

Harvested from Federal Laboratory Consortium Data.json

Additional Metadata

Resource Type Dataset
Metadata Created Date March 8, 2017
Metadata Updated Date March 8, 2017
Publisher Federal Laboratory Consortium
Unique Identifier 4C0F42DA-EB7E-42A7-A16D-265FFC683FEA
Maintainer Email
Public Access Level public
Address1 RDAR-EIB
Metadata Context https://project-open-data.cio.gov/v1.1/schema/catalog.jsonld
Schema Version https://project-open-data.cio.gov/v1.1/schema
Catalog Describedby https://project-open-data.cio.gov/v1.1/schema/catalog.json
Expertise Capabilities:Design, fabrication, and testing of prototype circuits for new or improved products.Troubleshooting and evaluation of existing electronic circuits and equipment using specially designed test circuits and test fixtures.Stress testing of electronic assemblies over temperature and set-back acceleration.Failure analysis of items in development or production to determine the precise cause of the failure and recommended solution.High G survivability of electronic circuits and systems.Reverse engineering of products to provide valuable insight into how a competitive product functions.Analysis and optimization of performance resulting from component or circuit modification.DC to radio frequency (RF) design, analysis, and simulation.Use of Application Specific Integrated Circuits (ASIC) to reduce product cost and improve performance.Tolerance analysis, environmental tests, and other problem prevention means.
Flcbusinessurl https://flcbusiness.federallabs.org/#/laboratory/3478
Harvest Object Id 4ba8cbec-ecd7-460c-b2dc-975050b0d5b8
Harvest Source Id 5859cfed-553c-48de-a478-b67b5225f6fc
Harvest Source Title Federal Laboratory Consortium Data.json
Phone 9737244875
Postalcode 07806-5000
Repphone 9737244875
Sizesqft 0
Source Datajson Identifier True
Source Hash 2e4c8d3168cd3bd04180a80557e8f2759d88c3a7
Source Schema Version 1.1
Statecode NJ

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