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Federal
Characterization data on the effects of micro-computed tomography-based x-ray radiation on vinyl nitrile foam
Department of Commerce —
This dataset contains information from investigating the effects of micro-computed tomographic imaging irradiation on vinyl nitrile foam and code for a finite element... -
Federal
Characterization data on the effects of micro-computed tomography-based x-ray radiation on vinyl nitrile foam
National Institute of Standards and Technology —
This dataset contains information from investigating the effects of micro-computed tomographic imaging irradiation on vinyl nitrile foam and code for a finite element... -
Federal
Automated particle analysis (SEM/EDS) data from samples known to have been exposed to gunshot residue and from samples occasionally mistaken for gunshot residue - like brake dust and fireworks.
Department of Commerce —
Automated particle analysis (SEM/EDS) data from samples known to have been exposed to gunshot residue and from samples occasionally mistaken for gunshot residue -... -
Federal
Data to accompany "Low Electron Beam Energy X-ray Microanalysis: The Adventure Continues!"
National Institute of Standards and Technology —
EDS spectra measured at E0 = 5 keV for 75 materials are provided along with the standards used for quantification with the NIST DTSA-II software for electron-excited... -
Federal
SEM/EDS hyperspectral data set from platinum group mineral ore embedded in epoxy
Department of Commerce —
SEM/EDS hyperspectral data set from platinum group mineral ore embedded in epoxy Live time/pixel: 4.01.33600.0/(512*512) # 1.3 hours on 4 detectors Energy scale: 10... -
Federal
SEM/EDS hyperspectral data set from platinum group mineral ore embedded in epoxy
National Institute of Standards and Technology —
SEM/EDS hyperspectral data set from platinum group mineral ore embedded in epoxy Live time/pixel: 4.01.33600.0/(512*512) # 1.3 hours on 4 detectors Energy scale: 10... -
Federal
Data to accompany "Low Electron Beam Energy X-ray Microanalysis: The Adventure Continues!"
Department of Commerce —
EDS spectra measured at E0 = 5 keV for 75 materials are provided along with the standards used for quantification with the NIST DTSA-II software for electron-excited... -
Federal
Automated particle analysis (SEM/EDS) data from samples known to have been exposed to gunshot residue and from samples occasionally mistaken for gunshot residue - like brake dust and fireworks.
National Institute of Standards and Technology —
Automated particle analysis (SEM/EDS) data from samples known to have been exposed to gunshot residue and from samples occasionally mistaken for gunshot residue -...