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CHIPS-FF: Evaluating Universal Machine Learning Force Fields for Material Properties

Published by National Institute of Standards and Technology | National Institute of Standards and Technology | Catalog Last Checked: September 02, 2026 at 07:19 PM | Dataset Last Updated: January 14, 2025
Data types to include: formation energy, bandgaps, band offsets, work function, surface energy, defect formation energy, IV-curves, STEM images, electrical measurements, surface roughness, thermal properties, phonons

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